Zero-G Devices
Radiation Tolerant Logic Devices
NAND gate, Schmitt-Trigger, 4 channels, 2 inputs. Features typical current consumption of < 2 uA, and propagation delay of ~ 15 ns at 6 V.
ZG54HC132
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Package: SOIC-14
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Operating voltage range: 2V to 6V
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Reliability: AEC-Q100 Qualified
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Temperature: -40C to 125C
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Radiation: SEL immune to LET of 37 MeV-cm2/mg
NAND gate, 2 channels, 4 inputs. Features low quiescent current of 1 uA and propagation delay of 50ns at 15V.​​
ZG54CD00
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Package: SOIC-14
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Operating voltage range: 3V to 18V
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Reliability: AEC-Q100 Qualified
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Temperature: -55C to 125C
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Radiation: SEL immune to LET of 58 MeV-cm2/mg
NAND gate, Inverters, Schmitt-Trigger inputs, 6 channels. Features typical current consumption of < 2 uA, and propagation delay of ~ 10 ns at 6 V.
ZG54HC14
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Package: SOIC-14
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Operating voltage range: 2V to 6V
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Reliability: AEC-Q100 Qualified
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Temperature: -40C to 125C
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Radiation: SEL immune to LET of 37 MeV-cm2/mg
Buffer with 3-state outputs, 8 channel. Features low power consumption of 8 uA at 25C, and propagation delay approximately 10 ns at 6 V.
ZG54HC244
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Package: SOIC-20
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Operating voltage range: 2V to 6V
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Reliability: AEC-Q100 Qualified
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Temperature: -40C to 125C
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Radiation: SEL immune to LET of 37 MeV-cm2/mg
Buffer with TTL-compatible CMOS inputs and 3-state outputs, 8 channel. Features low power consumption of 8 uA at 25C, and propagation delay of approximately 13 ns at 5.5 V.
ZG54HCT244
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Package: TSSOP-20
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Operating voltage range: 4.5V to 5.5V
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Reliability: AEC-Q100 Qualified
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Temperature: -40C to 125C
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Radiation: SEL immune to LET of 37 MeV-cm2/mg
Flip-Flop with dual D-type positive-edge-triggered with clear and preset. Features current consumption of < 4 uA at 25C, and propagation delay of 10-50 ns.
ZG54HC74
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Package: SOIC-14
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Operating voltage range: 2V to 6V
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Reliability: AEC-Q100 Qualified
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Temperature: -40C to 125C
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Radiation: SEL immune to LET of 58 MeV-cm2/mg
Logic Gates
Buffers
Flip Flop
Our selection of logic devices features state-of-the-art performance encased in small footprint plastic packages. To meet the harsh environment of space missions, the devices are radiation qualified for heavy ion single-event effect (SEE) performance including single-event latchup (SEL) immunity. Request a quote or datasheet below.