Zero-G Devices
Radiation Tolerant Logic Devices
NAND gate, Schmitt-Trigger, 4 channels, 2 inputs. Features typical current consumption of < 2 uA, and propagation delay of ~ 15 ns at 6 V.
ZG54HC132
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Package: SOIC-14
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Operating voltage range: 2V to 6V
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Reliability: AEC-Q100 Qualified
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Temperature: -40C to 125C
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Radiation: SEL immune to LET of 37 MeV-cm2/mg
NAND gate, 2 channels, 4 inputs. Features low quiescent current of 1 uA and propagation delay of 50ns at 15V.​​
ZG54CD00
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Package: SOIC-14
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Operating voltage range: 3V to 18V
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Reliability: Commercial
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Temperature: -55C to 125C
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Radiation: SEL immune to LET of 58 MeV-cm2/mg
Inverters, Schmitt-Trigger inputs, 6 channels. Features typical current consumption of < 2 uA, and propagation delay of ~ 10 ns at 6 V.
ZG54HC14
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Package: SOIC-14
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Operating voltage range: 2V to 6V
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Reliability: AEC-Q100 Qualified
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Temperature: -40C to 125C
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Radiation: SEL immune to LET of 60 MeV-cm2/mg
Buffer with 3-state outputs, 8 channel. Features low power consumption of 8 uA at 25C, and propagation delay approximately 10 ns at 6 V.
ZG54HC244
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Package: SOIC-20
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Operating voltage range: 2V to 6V
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Reliability: AEC-Q100 Qualified
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Temperature: -40C to 125C
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Radiation: SEL immune to LET of 83 MeV-cm2/mg
Buffer with TTL-compatible CMOS inputs and 3-state outputs, 8 channel. Features low power consumption of 8 uA at 25C, and propagation delay of approximately 13 ns at 5.5 V.
ZG54HCT244
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Package: TSSOP-20
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Operating voltage range: 4.5V to 5.5V
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Reliability: AEC-Q100 Qualified
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Temperature: -40C to 125C
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Radiation: SEL immune to LET of 83 MeV-cm2/mg
Flip-Flop with dual D-type positive-edge-triggered with clear and preset. Features current consumption of < 4 uA at 25C, and propagation delay of 10-50 ns.
ZG54HC74
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Package: SOIC-14
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Operating voltage range: 2V to 6V
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Reliability: AEC-Q100 Qualified
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Temperature: -40C to 125C
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Radiation: SEL immune to LET of 58 MeV-cm2/mg
Logic Gates
Buffers
Flip Flop
Our selection of logic devices features state-of-the-art performance encased in small footprint plastic packages. To meet the harsh environment of space missions, the devices are radiation qualified for heavy ion single-event effect (SEE) performance including single-event latchup (SEL) immunity. Review AEC-Q100 reliability qualification test flows. Request a quote or datasheet below.
Inverter
Buffer, 8 channel bus, 3 state output, 1.65V - 3.6V, Typical Icc of 1 uA, Propagation delay of 5.9 ns at 3.3 V
ZG54LVC244
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Package: SSOP-20
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Operating voltage range: 1.65V to 3.65V
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Reliability: Commercial
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Temperature: -40C to 125C
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Radiation: SEL immune to LET of 60 MeV-cm2/mg
Inverter, Schmitt trigger, 6 channels, 2.7V - 3.6V, Max Icc 10 uA, Typical propagation delay of 1 to 6.4 ns at 3.3 V
ZG54LVC14
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Package: SOIC-14
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Operating voltage range: 1.65V to 5.5V
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Reliability: Commercial
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Temperature: -40C to 85C
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Radiation: SEL immune to LET of 60 MeV-cm2/mg
Magnitude comparator, 8-bit, 2.7V - 3.6V, Max Icc 8 uA, Typical propagation delay of 14 to 34 ns at 4.5 V
ZG54HC688
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Package: SOIC-20
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Operating voltage range: 2V to 6V
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Reliability: Commercial
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Temperature: -55C to 125C
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Radiation: SEL immune to LET of 83 MeV-cm2/mg