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Symbol
Description
Test Number
Sample Size
Lot Size
Acceptance Criteria
Test Method
THB or HAST
Temperature-Humidity- Bias or Biased HAST
A2
77
3
0 Fails
JEDEC JESD22-A101 or A110
AC or UHST or TH
Autoclave or Unbiased HAST or Temperature- Humidity (without Bias)
A3
77
3
0 Fails
JEDEC JESD22-A102, A118, or A101
TC
Temperature Cycling
A4
77
3
0 Fails
JEDEC JESD22-A104 and Appendix 3
HTSL
High Temperature Storage Life
A6
45
1
0 Fails
JEDEC JESD22-A103

Testing Group A

Symbol
Description
Test Number
Sample Size
Lot Size
Acceptance Criteria
Test Method
HTOL
High Temperature Operating Life
B1
77
3
0 Fails
JEDEC JESD22-A108
ELFR
Early Life Failure Rate
B2
800
3
0 Fails
AEC Q100-008

Testing Group B

Symbol
Description
Test Number
Sample Size
Lot Size
Acceptance Criteria
Test Method
WBS
Wire Bond Shear
C1
30 bonds from a minimum of 5 devices
30 bonds from a minimum of 5 devices
CPK > 1.67
AEC Q100-001 AEC Q003
WBP
Wire Bond Pull
C2
30 bonds from a minimum of 5 devices
30 bonds from a minimum of 5 devices
CPK >1.67 or 0 Fails after TC (test #A4)
MIL-STD883 Method 2011 AEC Q003
SD
Solderability
C3
15
1
per J-STD-002
JEDEC J-STD-002
PD
Physical Dimensions
C4
10
3
CPK >1.67
JEDEC JESD22-B100 and B108 AEC Q003
SBS
Solder Ball Shear
C5
5 balls from a min of 10 devices
3
Cpk >1.67
AEC Q100-010 AEC Q003

Testing Group C

Symbol
Description
Test Number
Sample Size
Lot Size
Acceptance Criteria
Test Method
EM
Electromigration
D1
---
---
---
---
TDDB
Time Dependent Dielectric Breakdown
D2
---
---
---
---
HCI
Hot Carrier Injection
D3
---
---
---
---
BTI
Bias Temperature Instability
D4
---
---
-
---
SM
Stress Migration
D5
---
---
---
---

Testing Group D

Symbol
Description
Test Number
Sample Size
Lot Size
Acceptance Criteria
Test Method
HBM
Electrostatic Discharge Human Body Model
E2
See Test Method
1
Target: 0 Fails 2KV HBM (Classification 2 or better) For ? 28nm or RF operating frequency: 1KV HBM (Classification 1C or better)
AEC Q100-002
CDM
Electrostatic Discharge Charged Device Model
E3
See Test Method
1
Target: 0 Fails Test Condition 750 corner pins, Test Condition 500 all other pins (Classification C2A or better) For ? 28nm or RF operating frequency: Test Condition 250 (Classification C1 or better)
AEC Q100-011
LU
Latch-Up
E4
3
1
0 Fails
AEC Q100-004
ED
Electrical Distributions
E5
30
3
Where applicable, CpK > 1.67
AEC Q100-009 AEC Q003

Testing Group E

Automotive-Grade Qualification

Up-screened automotive-grade parts are qualified per AEC-Q100 standards and test flows. The applicable test methods are outlined below. These qualification tests are not applicable for up-screened products from commercial processes.

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