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Parameter
Test Condition
Min
Max
Unit
Supply voltage (VCC)
2
6
V
Input voltage (VI)
0
VCC
V
Output voltage (VO)
0
VCC
V
Operating temperature in air (TA)
-40
125
°C
Input clamp current (IIK)
VI < 0 or VI > VCC
±20
mA
Output clamp current (IOK)
VO < 0 or VO > VCC
±20
mA
Continuous output current (IOK)
VO = 0 to VCC
±25
mA
Continuous current through VCC or GND (IOK)
±50
mA
Input leakage current (IL)
Vcc = 6 V
±100
nA
Supply current (ICC)
Vcc = 6 V
2
μA
Input capacitance (Ci)
Vcc = 2 V to 6 V
10
pF
Propagation delay (Tpd)
Vcc = 6 V
32
ns
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ZG54HC132

NAND gate, automotive-grade, SEL immune to LET of 37 MeV-cm2/mg.

The ZG54HC132 is a Schmitt-Trigger NAND gate with 4 channels and 2 inputs. The part features typical current consumption of < 2 uA, and propagation delay of ~ 15 ns at 6 V. The part is qualified to AEC-Q100 standards. View the reliability testing flow here. We have performed radiation qualification for SEL immunity up to LET of 37 MeV-cm2/mg. The part is available in a SOIC-14 package.

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